Abstract
High resolution transmission electron microscopy can play a fundamental role in the understanding of heterojunction interfaces. Recently, this technique has been applied to the study of semiconductor materials. Results regarding interface epitaxial relationships for a varied number of systems are presented. The experimental methods and limitations of the technique are discussed.
Original language | English (US) |
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Pages (from-to) | 215-219 |
Number of pages | 5 |
Journal | Ultramicroscopy |
Volume | 9 |
Issue number | 3 |
DOIs | |
State | Published - 1982 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation