TY - JOUR
T1 - Imaging Local Electric Field Distribution by Plasmonic Impedance Microscopy
AU - Wang, Yixian
AU - Shan, Xiaonan
AU - Wang, Shaopeng
AU - Tao, Nongjian
AU - Blanchard, Pierre Yves
AU - Hu, Keke
AU - Mirkin, Michael V.
N1 - Publisher Copyright:
© 2015 American Chemical Society.
PY - 2016/2/2
Y1 - 2016/2/2
N2 - We report on imaging of local electric field on an electrode surface with plasmonic electrochemical impedance microscopy (P-EIM). The local electric field is created by putting an electrode inside a micropipet positioned over the electrode and applying a voltage between the two electrodes. We show that the distribution of the surface charge as well as the local electric field at the electrode surface can be imaged with P-EIM. The spatial distribution and the dependence of the local charge density and electric field on the distance between the micropipet and the surface are measured, and the results are compared with the finite element calculations. The work also demonstrates the possibility of integrating plasmonic imaging with scanning ion conductance microscopy (SICM) and other scanning probe microscopies.
AB - We report on imaging of local electric field on an electrode surface with plasmonic electrochemical impedance microscopy (P-EIM). The local electric field is created by putting an electrode inside a micropipet positioned over the electrode and applying a voltage between the two electrodes. We show that the distribution of the surface charge as well as the local electric field at the electrode surface can be imaged with P-EIM. The spatial distribution and the dependence of the local charge density and electric field on the distance between the micropipet and the surface are measured, and the results are compared with the finite element calculations. The work also demonstrates the possibility of integrating plasmonic imaging with scanning ion conductance microscopy (SICM) and other scanning probe microscopies.
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U2 - 10.1021/acs.analchem.5b04382
DO - 10.1021/acs.analchem.5b04382
M3 - Article
C2 - 26709980
AN - SCOPUS:84957601104
SN - 0003-2700
VL - 88
SP - 1547
EP - 1552
JO - Analytical Chemistry
JF - Analytical Chemistry
IS - 3
ER -