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Identifying the source of BW failures in high-frequency linear analog circuits based on S-parameter measurements
Fang Liu,
Sule Ozev
, Martin Brooke
Research output
:
Contribution to journal
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Article
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peer-review
5
Scopus citations
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Dive into the research topics of 'Identifying the source of BW failures in high-frequency linear analog circuits based on S-parameter measurements'. Together they form a unique fingerprint.
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Engineering & Materials Science
Scattering parameters
100%
Analog circuits
98%
Bandwidth
55%
Transistors
37%
Semiconductor devices
25%
Evolutionary algorithms
20%
Sensitivity analysis
19%
Large scale systems
18%
Silicon
17%
Set theory
14%
Uncertainty
13%
Networks (circuits)
12%
Communication
11%