Identification of point defects using high-resolution electron energy loss spectroscopy

Shuo Wang, Katia March, Fernando Ponce, Peter Rez

Research output: Contribution to journalArticle

Abstract

Although there are many techniques that can detect bandgap states associated with point defects in the lattice, it is not routinely possible to determine the type of defect at submicron spatial resolution. Here we show that high-resolution electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope can locate and identify point defects with a resolution of about 10 nm in a wide-bandgap BAlN semiconductor. B interstitials, N vacancies, as well as other point defects have been experimentally detected using EELS and have been identified using density functional theory.

Original languageEnglish (US)
Article number115312
JournalPhysical Review B
Volume99
Issue number11
DOIs
StatePublished - Mar 18 2019

Fingerprint

Electron energy loss spectroscopy
Point defects
point defects
energy dissipation
electron energy
high resolution
Energy gap
spectroscopy
Crystal lattices
Vacancies
Density functional theory
interstitials
Electron microscopes
electron microscopes
spatial resolution
Semiconductor materials
density functional theory
Scanning
Defects
scanning

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Identification of point defects using high-resolution electron energy loss spectroscopy. / Wang, Shuo; March, Katia; Ponce, Fernando; Rez, Peter.

In: Physical Review B, Vol. 99, No. 11, 115312, 18.03.2019.

Research output: Contribution to journalArticle

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