Identification of K most vulnerable nodes in multi-layered network using a new model of interdependency

Arunabha Sen, Anisha Mazumder, Joydeep Banerjee, Arun Das, Randy Compton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

35 Citations (Scopus)

Abstract

The critical infrastructures of a nation including the power grid and the communication network are highly interdependent. Recognizing the need for a deeper understanding of the interdependency in a multi-layered network, significant efforts have been made by the research community in the last few years to achieve this goal. Accordingly a number of models have been proposed and analyzed. Unfortunately, most of the models are over simplified and, as such, they fail to capture the complex interdependency that exists between entities of the power grid and the communication networks involving a combination of conjunctive and disjunctive relations. To overcome the limitations of existing models, we propose a new model that is able to capture such complex interdependency relations. Utilizing this model, we provide techniques to identify the K most 'vulnerable' nodes of an interdependent network. We show that the problem can be solved in polynomial time in some special cases, whereas for some others, the problem is NP-complete. We establish that this problem is equivalent to computation of a fixed point of a multilayered network system and we provide a technique for its computation utilizing Integer Linear Programming. Finally, we evaluate the efficacy of our technique using real data collected from the power grid and the communication network that span the Maricopa County of Arizona.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE INFOCOM
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages831-836
Number of pages6
ISBN (Print)9781479930883
DOIs
StatePublished - 2014
Event2014 IEEE Conference on Computer Communications Workshops, INFOCOM WKSHPS 2014 - Toronto, ON, Canada
Duration: Apr 27 2014May 2 2014

Other

Other2014 IEEE Conference on Computer Communications Workshops, INFOCOM WKSHPS 2014
CountryCanada
CityToronto, ON
Period4/27/145/2/14

Fingerprint

Telecommunication networks
Critical infrastructures
Linear programming
Computational complexity
Polynomials

ASJC Scopus subject areas

  • Computer Science(all)
  • Electrical and Electronic Engineering

Cite this

Sen, A., Mazumder, A., Banerjee, J., Das, A., & Compton, R. (2014). Identification of K most vulnerable nodes in multi-layered network using a new model of interdependency. In Proceedings - IEEE INFOCOM (pp. 831-836). [6849338] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/INFCOMW.2014.6849338

Identification of K most vulnerable nodes in multi-layered network using a new model of interdependency. / Sen, Arunabha; Mazumder, Anisha; Banerjee, Joydeep; Das, Arun; Compton, Randy.

Proceedings - IEEE INFOCOM. Institute of Electrical and Electronics Engineers Inc., 2014. p. 831-836 6849338.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sen, A, Mazumder, A, Banerjee, J, Das, A & Compton, R 2014, Identification of K most vulnerable nodes in multi-layered network using a new model of interdependency. in Proceedings - IEEE INFOCOM., 6849338, Institute of Electrical and Electronics Engineers Inc., pp. 831-836, 2014 IEEE Conference on Computer Communications Workshops, INFOCOM WKSHPS 2014, Toronto, ON, Canada, 4/27/14. https://doi.org/10.1109/INFCOMW.2014.6849338
Sen A, Mazumder A, Banerjee J, Das A, Compton R. Identification of K most vulnerable nodes in multi-layered network using a new model of interdependency. In Proceedings - IEEE INFOCOM. Institute of Electrical and Electronics Engineers Inc. 2014. p. 831-836. 6849338 https://doi.org/10.1109/INFCOMW.2014.6849338
Sen, Arunabha ; Mazumder, Anisha ; Banerjee, Joydeep ; Das, Arun ; Compton, Randy. / Identification of K most vulnerable nodes in multi-layered network using a new model of interdependency. Proceedings - IEEE INFOCOM. Institute of Electrical and Electronics Engineers Inc., 2014. pp. 831-836
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