Abstract

Soaked-hydrogen irradiations show the {{rm H}-2} limits for the total-dose and dose-rate response of bipolar technologies. We use an analytical model to extrapolate experimental observations and generate an {{rm H}-2} limits/dose-rate safe-operating-area for various total-dose conditions. Results indicate that 0.1% is the {{rm H}-2} limit that can impact device degradation. We also show that the impact is larger for higher dose levels and that extra care needs to be taken when qualifying electronics for specific missions.

Original languageEnglish (US)
Article number7346510
Pages (from-to)2476-2481
Number of pages6
JournalIEEE Transactions on Nuclear Science
Volume62
Issue number6
DOIs
StatePublished - Dec 2015

Keywords

  • Bipolar
  • ELDRS
  • hydrogen contamination
  • packaging
  • total dose

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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