Abstract
The lattice structure of tetragonal zirconia phases in Al2O3/ZrO2 multilayers was studied by high resolution electron microscopy. A transmission electron microscope was used to measure the lattice spacings while a charge coupled device camera was employed to digitize the generated images. Results indicate that large volume fraction of tetragonal zirconia can be stabilized at room temperature without the need for dopants.
Original language | English (US) |
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Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
Editors | G.W. Bailey, A.J. Garratt-Reed |
Pages | 754-755 |
Number of pages | 2 |
State | Published - 1994 |
Externally published | Yes |
Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
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City | New Orleans, LA, USA |
Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- Engineering(all)