HREM study of tetragonal zirconia in Al2O3/ZrO2 multilayers

M. Gajdardziska-Josifovska, Martha McCartney, W. J. de Ruijter, C. M. Scanlan, C. R. Aita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The lattice structure of tetragonal zirconia phases in Al2O3/ZrO2 multilayers was studied by high resolution electron microscopy. A transmission electron microscope was used to measure the lattice spacings while a charge coupled device camera was employed to digitize the generated images. Results indicate that large volume fraction of tetragonal zirconia can be stabilized at room temperature without the need for dopants.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages754-755
Number of pages2
StatePublished - 1994
Externally publishedYes
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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