HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces

J. S. Bow; Ray Carpenter; M. J. Kim

HREM image simulation of Ti₅Si₃/TiC/6H-SiC interfaces

J. S. Bow, Ray Carpenter, M. J. Kim

Chemical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

High resolution electron microscopy and computer simulation were used to study the interface triad, Ti₅Si₃/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.

Original language	English (US)
Title of host publication	Proceedings - Annual Meeting, Microscopy Society of America
Editors	G.W. Bailey, A.J. Garratt-Reed
Pages	518-519
Number of pages	2
State	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

ASJC Scopus subject areas

General Engineering

Cite this

@inproceedings{1ddde0fdde4a463c9d7c83faaf56c002,

title = "HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces",

abstract = "High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.",

author = "Bow, {J. S.} and Ray Carpenter and Kim, {M. J.}",

year = "1994",

language = "English (US)",

pages = "518--519",

editor = "G.W. Bailey and A.J. Garratt-Reed",

booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

TY - GEN

T1 - HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces

AU - Bow, J. S.

AU - Carpenter, Ray

AU - Kim, M. J.

PY - 1994

Y1 - 1994

N2 - High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.

AB - High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.

UR - http://www.scopus.com/inward/record.url?scp=0028751105&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028751105&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:0028751105

SP - 518

EP - 519

BT - Proceedings - Annual Meeting, Microscopy Society of America

A2 - Bailey, G.W.

A2 - Garratt-Reed, A.J.

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

HREM image simulation of Ti₅Si₃/TiC/6H-SiC interfaces

Abstract

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ASJC Scopus subject areas

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