HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces

J. S. Bow, Ray Carpenter, M. J. Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages518-519
Number of pages2
StatePublished - 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

Fingerprint

High resolution electron microscopy
Interfaces (computer)
Crystals
Crystal orientation
Computer simulation

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Bow, J. S., Carpenter, R., & Kim, M. J. (1994). HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces. In G. W. Bailey, & A. J. Garratt-Reed (Eds.), Proceedings - Annual Meeting, Microscopy Society of America (pp. 518-519)

HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces. / Bow, J. S.; Carpenter, Ray; Kim, M. J.

Proceedings - Annual Meeting, Microscopy Society of America. ed. / G.W. Bailey; A.J. Garratt-Reed. 1994. p. 518-519.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bow, JS, Carpenter, R & Kim, MJ 1994, HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces. in GW Bailey & AJ Garratt-Reed (eds), Proceedings - Annual Meeting, Microscopy Society of America. pp. 518-519, Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, 7/31/94.
Bow JS, Carpenter R, Kim MJ. HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces. In Bailey GW, Garratt-Reed AJ, editors, Proceedings - Annual Meeting, Microscopy Society of America. 1994. p. 518-519
Bow, J. S. ; Carpenter, Ray ; Kim, M. J. / HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces. Proceedings - Annual Meeting, Microscopy Society of America. editor / G.W. Bailey ; A.J. Garratt-Reed. 1994. pp. 518-519
@inproceedings{1ddde0fdde4a463c9d7c83faaf56c002,
title = "HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces",
abstract = "High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.",
author = "Bow, {J. S.} and Ray Carpenter and Kim, {M. J.}",
year = "1994",
language = "English (US)",
pages = "518--519",
editor = "G.W. Bailey and A.J. Garratt-Reed",
booktitle = "Proceedings - Annual Meeting, Microscopy Society of America",

}

TY - GEN

T1 - HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces

AU - Bow, J. S.

AU - Carpenter, Ray

AU - Kim, M. J.

PY - 1994

Y1 - 1994

N2 - High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.

AB - High resolution electron microscopy and computer simulation were used to study the interface triad, Ti5Si3/TiC/6H-SiC. The TiC thickness, interlayer dimension normal to the interfaces and the size of the required supercell were analyzed. First, a block of 6H-SiC crystal and a block of TiC crystal were synthesized. An intermediate supercell was then built by combining the two crystals. Orientation relationship was determined from experimental data. Finally, HREM images were simulated from the supercell.

UR - http://www.scopus.com/inward/record.url?scp=0028751105&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028751105&partnerID=8YFLogxK

M3 - Conference contribution

SP - 518

EP - 519

BT - Proceedings - Annual Meeting, Microscopy Society of America

A2 - Bailey, G.W.

A2 - Garratt-Reed, A.J.

ER -