HREM and AEM study of Pt/SiC interface annealed at high temperature

J. S. Bow, L. M. Porter, M. J. Kim, Ray Carpenter, R. F. Davis

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    Fingerprint

    Dive into the research topics of 'HREM and AEM study of Pt/SiC interface annealed at high temperature'. Together they form a unique fingerprint.

    Engineering & Materials Science