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Homoepitaxial GaN layers studied by low-energy electron microscopy, atomic force microscopy and transmission electron microscopy
A. Pavlovska, V. M. Torres, J. L. Edwards, E. Bauer, David Smith, R. B. Doak, I. S T Tsong, D. B. Thomson, R. F. Davis
Research output: Contribution to journal › Conference article › peer-review
3
Scopus
citations