Abstract
A model-based fitting algorithm for electron energy-loss spectroscopy spectra is introduced, along with an intuitive user-interface. As with Verbeeck & Van Aert, the measured spectrum, rather than the single scattering distribution, is fit over a wide range. An approximation is developed that allows for accurate modeling while maintaining linearity in the parameters that represent elemental composition. Also, a method is given for generating a model for the low-loss background that incorporates plural scattering. Operation of the user-interface is described to demonstrate the ease of use that allows even nonexpert users to quickly obtain elemental analysis results.
Original language | English (US) |
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Pages (from-to) | 798-806 |
Number of pages | 9 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | 3 |
DOIs | |
State | Published - Jun 2014 |
Keywords
- EELS
- fitting
- model
- multiple scattering
- plural scattering
- quantification
ASJC Scopus subject areas
- Instrumentation