High speed redundant self-correcting circuits for radiation hardened by design logic

Nathan D. Hindman, David E. Pettit, Dan W. Patterson, Kyle E. Nielsen, Xiaoyin Yao, Keith Holbert, Lawrence T. Clark

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

Self-correcting fine-grained triple redundant circuits using majority gate feedback for single event upset and transient radiation hardening are described and compared to other hardening approaches. The approach votes the triple modular redundant (TMR) state in the state element feedback path, which allows high performance commensurate with commercial integrated circuits. Clock gating is supported. The TMR self-correcting approach is used in a built-in self-test engine to evaluate a 16 k-byte cache design. The circuits have been fabricated on a 90 nm low standby power bulk CMOS process. Data paths have been tested at clock frequencies up to 500 MHz. TID tests using Co-60 indicate negligible standby current increase at over 2 Mrad(Si) and ion tests show SEE hardness beyond 100 MeV-cm2/mg LET.

Original languageEnglish (US)
Title of host publication2009 European Conference on Radiation and Its Effects on Components and Systems
Subtitle of host publication10th RADECS Conference, RADECS 2009
Pages465-472
Number of pages8
DOIs
StatePublished - Dec 1 2009
Event2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009 - Bruges, Belgium
Duration: Sep 14 2009Sep 18 2009

Publication series

NameProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Other

Other2009 10th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2009
CountryBelgium
CityBruges
Period9/14/099/18/09

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Keywords

  • Radiation hardening by design
  • microprocessor
  • redundant systems
  • registers

ASJC Scopus subject areas

  • Radiation
  • Electrical and Electronic Engineering

Cite this

Hindman, N. D., Pettit, D. E., Patterson, D. W., Nielsen, K. E., Yao, X., Holbert, K., & Clark, L. T. (2009). High speed redundant self-correcting circuits for radiation hardened by design logic. In 2009 European Conference on Radiation and Its Effects on Components and Systems: 10th RADECS Conference, RADECS 2009 (pp. 465-472). [5994697] (Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS). https://doi.org/10.1109/RADECS.2009.5994697