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Dive into the research topics of 'HIGH RESOLUTION Z-CONTRAST IMAGING AND LATTICE LOCATION ANALYSIS OF DOPANTS IN ION-IMPLANTED SILICON.'. Together they form a unique fingerprint.- Sort by
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S. J. Pennycook, J. Narayan, R. J. Culbertson, E. Fogarassy
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution