High-resolution scanning electron microscopy of surface reactions

Jingyue Liu; J. M. Cowley

doi:10.1016/0304-3991(87)90257-9

High-resolution scanning electron microscopy of surface reactions

Jingyue Liu, J. M. Cowley

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

High-resolution (< 10 A ̊) and high-quality secondary electron (SE) images can be obtained from specimens in the high-resolution imaging position of a HB5 dedicated STEM instrument, in parallel with STEM or SREM imaging and with microdiffraction and microanalysis using EELS. The additional information obtained by the SEM arises from the possibility of revealing three-dimensional morphology and sensitivity to the chemical composition of surface layers. Examples include evidence of a reaction between Pd and MgO substrate and the formation of Ni by reduction of NiO under electron beam irradiation.

Original language	English (US)
Pages (from-to)	463-472
Number of pages	10
Journal	Ultramicroscopy
Volume	23
Issue number	3-4
DOIs	https://doi.org/10.1016/0304-3991(87)90257-9
State	Published - 1987

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(87)90257-9

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@article{fc5ed628e3334608a99969e84639b91a,

title = "High-resolution scanning electron microscopy of surface reactions",

abstract = "High-resolution (< 10 A ̊) and high-quality secondary electron (SE) images can be obtained from specimens in the high-resolution imaging position of a HB5 dedicated STEM instrument, in parallel with STEM or SREM imaging and with microdiffraction and microanalysis using EELS. The additional information obtained by the SEM arises from the possibility of revealing three-dimensional morphology and sensitivity to the chemical composition of surface layers. Examples include evidence of a reaction between Pd and MgO substrate and the formation of Ni by reduction of NiO under electron beam irradiation.",

author = "Jingyue Liu and Cowley, {J. M.}",

note = "Funding Information: This work was supported by NSF grant DMR 8510059 and made use of the resources of the Facility for High Resolution Electron Microscopy, supported by the NSF grant 8306501.",

year = "1987",

doi = "10.1016/0304-3991(87)90257-9",

language = "English (US)",

volume = "23",

pages = "463--472",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "3-4",

}

TY - JOUR

T1 - High-resolution scanning electron microscopy of surface reactions

AU - Liu, Jingyue

AU - Cowley, J. M.

N1 - Funding Information: This work was supported by NSF grant DMR 8510059 and made use of the resources of the Facility for High Resolution Electron Microscopy, supported by the NSF grant 8306501.

PY - 1987

Y1 - 1987

N2 - High-resolution (< 10 A ̊) and high-quality secondary electron (SE) images can be obtained from specimens in the high-resolution imaging position of a HB5 dedicated STEM instrument, in parallel with STEM or SREM imaging and with microdiffraction and microanalysis using EELS. The additional information obtained by the SEM arises from the possibility of revealing three-dimensional morphology and sensitivity to the chemical composition of surface layers. Examples include evidence of a reaction between Pd and MgO substrate and the formation of Ni by reduction of NiO under electron beam irradiation.

AB - High-resolution (< 10 A ̊) and high-quality secondary electron (SE) images can be obtained from specimens in the high-resolution imaging position of a HB5 dedicated STEM instrument, in parallel with STEM or SREM imaging and with microdiffraction and microanalysis using EELS. The additional information obtained by the SEM arises from the possibility of revealing three-dimensional morphology and sensitivity to the chemical composition of surface layers. Examples include evidence of a reaction between Pd and MgO substrate and the formation of Ni by reduction of NiO under electron beam irradiation.

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U2 - 10.1016/0304-3991(87)90257-9

DO - 10.1016/0304-3991(87)90257-9

M3 - Article

AN - SCOPUS:0023530984

SN - 0304-3991

VL - 23

SP - 463

EP - 472

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 3-4

ER -

High-resolution scanning electron microscopy of surface reactions

Abstract

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