High-resolution scanning electron microscopy for the characterization of supported metal catalysts

David Smith, M. H. Yao, L. F. Allard, A. K. Datye

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

A scanning electron microscope with a short-focal-length "immersion" lens and subnanometer resolution has been used to characterize several oxide-supported metal particle catalysts. Nanometer-sized metal particles in the Pt/TiO2 and Pd/SiO2 systems could be imaged with best clarity at the upper end of the operating voltage range (20-30 kV). However, visibility depended upon an adequate yield of secondary electrons relative to the support: small Pt particles on CeO2 could not be located by secondary electron imaging. Best visibility of the surface topography of the support was obtained at lower accelerating voltages.

Original languageEnglish (US)
Pages (from-to)57-64
Number of pages8
JournalCatalysis Letters
Volume31
Issue number1
DOIs
StatePublished - Mar 1 1995

Keywords

  • scanning electron microscopy (SEM)
  • small metal particles
  • supported metal catalysts

ASJC Scopus subject areas

  • Catalysis
  • Chemistry(all)

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