High-resolution scanning electron microscopy for the characterization of supported metal catalysts

David Smith; M. H. Yao; L. F. Allard; A. K. Datye

doi:10.1007/BF00817033

High-resolution scanning electron microscopy for the characterization of supported metal catalysts

David Smith, M. H. Yao, L. F. Allard, A. K. Datye

Electrical Engineering

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

A scanning electron microscope with a short-focal-length "immersion" lens and subnanometer resolution has been used to characterize several oxide-supported metal particle catalysts. Nanometer-sized metal particles in the Pt/TiO₂ and Pd/SiO₂ systems could be imaged with best clarity at the upper end of the operating voltage range (20-30 kV). However, visibility depended upon an adequate yield of secondary electrons relative to the support: small Pt particles on CeO₂ could not be located by secondary electron imaging. Best visibility of the surface topography of the support was obtained at lower accelerating voltages.

Original language	English (US)
Pages (from-to)	57-64
Number of pages	8
Journal	Catalysis Letters
Volume	31
Issue number	1
DOIs	https://doi.org/10.1007/BF00817033
State	Published - Mar 1995

Keywords

scanning electron microscopy (SEM)
small metal particles
supported metal catalysts

ASJC Scopus subject areas

Catalysis
General Chemistry

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10.1007/BF00817033

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title = "High-resolution scanning electron microscopy for the characterization of supported metal catalysts",

abstract = "A scanning electron microscope with a short-focal-length {"}immersion{"} lens and subnanometer resolution has been used to characterize several oxide-supported metal particle catalysts. Nanometer-sized metal particles in the Pt/TiO2 and Pd/SiO2 systems could be imaged with best clarity at the upper end of the operating voltage range (20-30 kV). However, visibility depended upon an adequate yield of secondary electrons relative to the support: small Pt particles on CeO2 could not be located by secondary electron imaging. Best visibility of the surface topography of the support was obtained at lower accelerating voltages.",

keywords = "scanning electron microscopy (SEM), small metal particles, supported metal catalysts",

author = "David Smith and Yao, {M. H.} and Allard, {L. F.} and Datye, {A. K.}",

year = "1995",

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doi = "10.1007/BF00817033",

language = "English (US)",

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journal = "Catalysis Letters",

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AU - Smith, David

AU - Yao, M. H.

AU - Allard, L. F.

AU - Datye, A. K.

PY - 1995/3

Y1 - 1995/3

N2 - A scanning electron microscope with a short-focal-length "immersion" lens and subnanometer resolution has been used to characterize several oxide-supported metal particle catalysts. Nanometer-sized metal particles in the Pt/TiO2 and Pd/SiO2 systems could be imaged with best clarity at the upper end of the operating voltage range (20-30 kV). However, visibility depended upon an adequate yield of secondary electrons relative to the support: small Pt particles on CeO2 could not be located by secondary electron imaging. Best visibility of the surface topography of the support was obtained at lower accelerating voltages.

AB - A scanning electron microscope with a short-focal-length "immersion" lens and subnanometer resolution has been used to characterize several oxide-supported metal particle catalysts. Nanometer-sized metal particles in the Pt/TiO2 and Pd/SiO2 systems could be imaged with best clarity at the upper end of the operating voltage range (20-30 kV). However, visibility depended upon an adequate yield of secondary electrons relative to the support: small Pt particles on CeO2 could not be located by secondary electron imaging. Best visibility of the surface topography of the support was obtained at lower accelerating voltages.

KW - scanning electron microscopy (SEM)

KW - small metal particles

KW - supported metal catalysts

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High-resolution scanning electron microscopy for the characterization of supported metal catalysts

Abstract

Keywords

ASJC Scopus subject areas

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