High-resolution scanning electron microscopy and microanalysis of supported metal catalysts

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

The use of a high-brightness field emission gun and novel secondary electron detection systems makes it possible to acquire nanometer-resolution surface images of bulk materials, even at low electron beam voltages. The advantages of low-voltage SEM include enhanced surface sensitivity, reduced sample charging on non-conducting materials, and significantly reduced electron range and interaction volume. High-resolution images formed by collecting the backscattered electron signal can give information about the size and spatial distribution of metal nanoparticles in supported catalysts. Low-voltage XEDS can provide compositional information of bulk samples with enhanced surface sensitivity and significantly improved spatial resolution. High-resolution SEM techniques enhance our ability to detect and, subsequently, analyze the composition of nanoparticles in supported metal catalysts. Applications of high-resolution SEM imaging and microanalysis techniques to the study of industrial supported catalysts are discussed.

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium - Proceedings
Pages259-264
Number of pages6
Volume589
StatePublished - 2000
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Liu, J. (2000). High-resolution scanning electron microscopy and microanalysis of supported metal catalysts. In Materials Research Society Symposium - Proceedings (Vol. 589, pp. 259-264)