High-resolution interface analysis of SiC-whisker-reinforced Si3N4 and Al2O3 ceramic matrix composites

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

Whisker/matrix interfaces between β-SiC whiskers and β-Si3N4 or α-Al2O3 matrices in composites were examined by high-resolution electron microscopy (HREM), and electron energy loss (ELS) and energy dispersive X-ray (EDS) spectroscopies. Most whisker/matrix interfaces were crystalline, with whiskers directly bonded to matrix crystals. Some whisker/matrix interface regions contained amorphous thin films and these occurred more often in the Si3N4 composite, which contained sintering additives, than in the Al2O3 matrix composite, which did not. No evidence for light element segregation at crystalline whisker/matrix interfaces was detected by ELS or EDS at 5 nm spatial resolution. Impurities were concentrated in glassy regions in matrix grain boundaries, triple junctions, or at infrequent whisker/matrix interfaces containing amorphous films.

Original languageEnglish (US)
Pages (from-to)2949-2957
Number of pages9
JournalJournal of Materials Science
Volume25
Issue number6
DOIs
StatePublished - Jun 1990

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ceramic matrix composites
Crystal whiskers
Ceramic matrix composites
high resolution
matrices
Amorphous films
Energy dispersive spectroscopy
Energy dissipation
Composite materials
Crystalline materials
High resolution electron microscopy
composite materials
energy dissipation
Grain boundaries
Sintering
silicon nitride
Spectroscopy
Impurities
X rays
Thin films

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)

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High-resolution interface analysis of SiC-whisker-reinforced Si3N4 and Al2O3 ceramic matrix composites. / Braue, W.; Carpenter, Ray; Smith, David.

In: Journal of Materials Science, Vol. 25, No. 6, 06.1990, p. 2949-2957.

Research output: Contribution to journalArticle

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