Structural defects occurring in samples of plastically deformed, non-stoichiometric rutile, TiO//2// minus //x (0 less than x less than equivalent to 0. 0035), have been characterised by high resolution electron microscopy. Crystallographic shear planes (CSPs) were observed, although not seen previously in quenched non-deformed materials of this composition range, and these had considerable local disorder in orientation and structure. These observations imply a different precipitation mechanism for these defects in deformed samples. (100) platelet defects were also observed both in isolation and 'decorating' CSP. Computer image simulations offer a useful guide for interpreting high-resolution images of the CSP and the possibility of semi-quantitative or quantitative confirmation of models.
|Original language||English (US)|
|Title of host publication||Lawrence Berkeley Laboratory (Report) LBL|
|Editors||R.M. Fisher, R. Gronsky, K.H. Westmacott|
|Number of pages||4|
|State||Published - 1983|
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