HIGH-RESOLUTION IMAGING OF REDUCED AND DEFORMED RUTILES.

M. G. Blanchin, L. A. Bursill, David Smith, G. J. Wood

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Structural defects occurring in samples of plastically deformed, non-stoichiometric rutile, TiO//2// minus //x (0 less than x less than equivalent to 0. 0035), have been characterised by high resolution electron microscopy. Crystallographic shear planes (CSPs) were observed, although not seen previously in quenched non-deformed materials of this composition range, and these had considerable local disorder in orientation and structure. These observations imply a different precipitation mechanism for these defects in deformed samples. (100) platelet defects were also observed both in isolation and 'decorating' CSP. Computer image simulations offer a useful guide for interpreting high-resolution images of the CSP and the possibility of semi-quantitative or quantitative confirmation of models.

Original languageEnglish (US)
Title of host publicationLawrence Berkeley Laboratory (Report) LBL
EditorsR.M. Fisher, R. Gronsky, K.H. Westmacott
Pages381-384
Number of pages4
StatePublished - 1983
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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  • Cite this

    Blanchin, M. G., Bursill, L. A., Smith, D., & Wood, G. J. (1983). HIGH-RESOLUTION IMAGING OF REDUCED AND DEFORMED RUTILES. In R. M. Fisher, R. Gronsky, & K. H. Westmacott (Eds.), Lawrence Berkeley Laboratory (Report) LBL (pp. 381-384)