HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS.

R. Sinclair, Fernando Ponce, T. Yamashita, David Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
Original languageEnglish (US)
Title of host publicationInstitute of Physics Conference Series
Place of PublicationBristol, Engl
PublisherInst of Physics
Pages103-108
Number of pages6
Edition67
ISBN (Print)0854981586
StatePublished - 1983
Externally publishedYes

Fingerprint

electron microscopy
high resolution

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Sinclair, R., Ponce, F., Yamashita, T., & Smith, D. (1983). HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS. In Institute of Physics Conference Series (67 ed., pp. 103-108). Bristol, Engl: Inst of Physics.

HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS. / Sinclair, R.; Ponce, Fernando; Yamashita, T.; Smith, David.

Institute of Physics Conference Series. 67. ed. Bristol, Engl : Inst of Physics, 1983. p. 103-108.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Sinclair, R, Ponce, F, Yamashita, T & Smith, D 1983, HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS. in Institute of Physics Conference Series. 67 edn, Inst of Physics, Bristol, Engl, pp. 103-108.
Sinclair R, Ponce F, Yamashita T, Smith D. HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS. In Institute of Physics Conference Series. 67 ed. Bristol, Engl: Inst of Physics. 1983. p. 103-108
Sinclair, R. ; Ponce, Fernando ; Yamashita, T. ; Smith, David. / HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS. Institute of Physics Conference Series. 67. ed. Bristol, Engl : Inst of Physics, 1983. pp. 103-108
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