HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS.

R. Sinclair, F. A. Ponce, T. Yamashita, David J. Smith

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations
Original languageEnglish (US)
Title of host publicationInstitute of Physics Conference Series
PublisherInst of Physics
Pages103-108
Number of pages6
Edition67
ISBN (Print)0854981586
StatePublished - Dec 1 1983

Publication series

NameInstitute of Physics Conference Series
Number67
ISSN (Print)0373-0751

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Sinclair, R., Ponce, F. A., Yamashita, T., & Smith, D. J. (1983). HIGH RESOLUTION ELECTRON MICROSCOPY OF II-IV COMPOUND SEMICONDUCTORS. In Institute of Physics Conference Series (67 ed., pp. 103-108). (Institute of Physics Conference Series; No. 67). Inst of Physics.