High resolution electron beam profile monitor

William Graves, E. D. Johnson, P. G. O'Shea

Research output: Chapter in Book/Report/Conference proceedingChapter

5 Scopus citations

Abstract

A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the transverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Particle Accelerator Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1993-1995
Number of pages3
Volume2
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1997 17th Particle Accelerator Conference, PAC-97 - Vancouver, BC, CAN
Duration: May 12 1997May 16 1997

Other

OtherProceedings of the 1997 17th Particle Accelerator Conference, PAC-97
CityVancouver, BC, CAN
Period5/12/975/16/97

ASJC Scopus subject areas

  • Engineering(all)

Fingerprint Dive into the research topics of 'High resolution electron beam profile monitor'. Together they form a unique fingerprint.

  • Cite this

    Graves, W., Johnson, E. D., & O'Shea, P. G. (1998). High resolution electron beam profile monitor. In Proceedings of the IEEE Particle Accelerator Conference (Vol. 2, pp. 1993-1995). Institute of Electrical and Electronics Engineers Inc..