Abstract
A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the transverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings of the IEEE Particle Accelerator Conference |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 1993-1995 |
| Number of pages | 3 |
| Volume | 2 |
| State | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of the 1997 17th Particle Accelerator Conference, PAC-97 - Vancouver, BC, CAN Duration: May 12 1997 → May 16 1997 |
Other
| Other | Proceedings of the 1997 17th Particle Accelerator Conference, PAC-97 |
|---|---|
| City | Vancouver, BC, CAN |
| Period | 5/12/97 → 5/16/97 |
ASJC Scopus subject areas
- General Engineering