High resolution electron beam profile monitor

William Graves, E. D. Johnson, P. G. O'Shea

Research output: Chapter in Book/Report/Conference proceedingChapter

5 Citations (Scopus)

Abstract

A new beam diagnostic to measure transverse profiles of electron beams is described. This profile monitor uses a Yttrium:Aluminum:Garnet (YAG) crystal doped with a visible-light scintillator to produce an image of the transverse beam distribution. The advantage of this material over traditional fluorescent screens is that it is formed from a single crystal, and therefore has improved spatial resolution. The current system is limited to a resolution of about 10 microns. Improvements in the optical transport will enable measurements of RMS beam sizes of less than 1 micron. The total cost of the system is modest.

Original languageEnglish (US)
Title of host publicationProceedings of the IEEE Particle Accelerator Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1993-1995
Number of pages3
Volume2
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1997 17th Particle Accelerator Conference, PAC-97 - Vancouver, BC, CAN
Duration: May 12 1997May 16 1997

Other

OtherProceedings of the 1997 17th Particle Accelerator Conference, PAC-97
CityVancouver, BC, CAN
Period5/12/975/16/97

Fingerprint

Fluorescent screens
Garnets
Yttrium
Phosphors
Electron beams
Single crystals
Aluminum
Crystals
Costs

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Graves, W., Johnson, E. D., & O'Shea, P. G. (1998). High resolution electron beam profile monitor. In Proceedings of the IEEE Particle Accelerator Conference (Vol. 2, pp. 1993-1995). Institute of Electrical and Electronics Engineers Inc..

High resolution electron beam profile monitor. / Graves, William; Johnson, E. D.; O'Shea, P. G.

Proceedings of the IEEE Particle Accelerator Conference. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 1998. p. 1993-1995.

Research output: Chapter in Book/Report/Conference proceedingChapter

Graves, W, Johnson, ED & O'Shea, PG 1998, High resolution electron beam profile monitor. in Proceedings of the IEEE Particle Accelerator Conference. vol. 2, Institute of Electrical and Electronics Engineers Inc., pp. 1993-1995, Proceedings of the 1997 17th Particle Accelerator Conference, PAC-97, Vancouver, BC, CAN, 5/12/97.
Graves W, Johnson ED, O'Shea PG. High resolution electron beam profile monitor. In Proceedings of the IEEE Particle Accelerator Conference. Vol. 2. Institute of Electrical and Electronics Engineers Inc. 1998. p. 1993-1995
Graves, William ; Johnson, E. D. ; O'Shea, P. G. / High resolution electron beam profile monitor. Proceedings of the IEEE Particle Accelerator Conference. Vol. 2 Institute of Electrical and Electronics Engineers Inc., 1998. pp. 1993-1995
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