High resolution EELS study of Ge1-ySny and Ge1-x-ySixSny alloys

Liying Jiang; Toshihiro Aoki; John Kouvetakis; Jose Menendez

doi:10.1017/S1431927614004322

High resolution EELS study of Ge_1-ySn_y and Ge_1-x-ySi_xSn_y alloys

Liying Jiang, Toshihiro Aoki, John Kouvetakis, Jose Menendez

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	520-521
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614004322
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927614004322

Cite this

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title = "High resolution EELS study of Ge1-ySny and Ge1-x-ySixSny alloys",

author = "Liying Jiang and Toshihiro Aoki and John Kouvetakis and Jose Menendez",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614004322",

language = "English (US)",

volume = "20",

pages = "520--521",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - High resolution EELS study of Ge1-ySny and Ge1-x-ySixSny alloys

AU - Jiang, Liying

AU - Aoki, Toshihiro

AU - Kouvetakis, John

AU - Menendez, Jose

PY - 2014/8/1

Y1 - 2014/8/1

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U2 - 10.1017/S1431927614004322

DO - 10.1017/S1431927614004322

M3 - Conference article

AN - SCOPUS:84927935351

SN - 1431-9276

VL - 20

SP - 520

EP - 521

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

High resolution EELS study of Ge1-ySny and Ge1-x-ySixSny alloys

ASJC Scopus subject areas

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High resolution EELS study of Ge_1-ySn_y and Ge_1-x-ySi_xSn_y alloys