High resolution EELS study of Ge<inf>1-y</inf>Sn<inf>y</inf> and Ge<inf>1-x</inf>-ySi<inf>x</inf>Sn<inf>y</inf> alloys

Liying Jiang, Toshihiro Aoki, John Kouvetakis, Jose Menendez

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)520-521
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014

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Electron energy loss spectroscopy
high resolution

ASJC Scopus subject areas

  • Instrumentation

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High resolution EELS study of Ge<inf>1-y</inf>Sn<inf>y</inf> and Ge<inf>1-x</inf>-ySi<inf>x</inf>Sn<inf>y</inf> alloys. / Jiang, Liying; Aoki, Toshihiro; Kouvetakis, John; Menendez, Jose.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 520-521.

Research output: Contribution to journalArticle

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