High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst

Jingyue Liu, G. G. Hembree, G. E. Spinnler, J. A. Venables

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

High spatial resolution Auger electron spectra and scanning Auger microscope (SAM) images of supported metal catalysts have been obtained in a UHV scanning transmission electron microscope. Ag/α-Al2O3 was used as a model catalyst system, where silver was evaporated, in situ, onto polycrystalline alumina carriers. Silver particles, as small as 2 nm in diameter, were clearly revealed in SAM images with high contrast. On large islands, an edge resolution < 3 nm was achieved. Information about surface and bulk properties of supported catalysts can be extracted from images formed with different signals generated from the same area which are obtained simultaneously.

Original languageEnglish (US)
JournalSurface Science
Volume262
Issue number3
DOIs
StatePublished - Feb 15 1992

Fingerprint

Auger electron spectroscopy
Electron microscopy
Auger spectroscopy
electron spectroscopy
electron microscopy
Metals
Scanning
Silver
catalysts
Catalysts
scanning
high resolution
Microscopes
microscopes
silver
metals
Aluminum Oxide
Catalyst supports
surface properties
Electron microscopes

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst. / Liu, Jingyue; Hembree, G. G.; Spinnler, G. E.; Venables, J. A.

In: Surface Science, Vol. 262, No. 3, 15.02.1992.

Research output: Contribution to journalArticle

Liu, Jingyue ; Hembree, G. G. ; Spinnler, G. E. ; Venables, J. A. / High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst. In: Surface Science. 1992 ; Vol. 262, No. 3.
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