High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst

Jingyue Liu, G. G. Hembree, G. E. Spinnler, J. A. Venables

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High spatial resolution Auger electron spectra and scanning Auger microscope (SAM) images of supported metal catalysts have been obtained in a UHV scanning transmission electron microscope. Ag/α-Al2O3 was used as a model catalyst system, where silver was evaporated, in situ, onto polycrystalline alumina carriers. Silver particles, as small as 2 nm in diameter, were clearly revealed in SAM images with high contrast. On large islands, an edge resolution < 3 nm was achieved. Information about surface and bulk properties of supported catalysts can be extracted from images formed with different signals generated from the same area which are obtained simultaneously.

Original languageEnglish (US)
Pages (from-to)L111-L117
JournalSurface Science
Issue number3
StatePublished - Feb 15 1992


ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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