High resolution Auger electron imaging of supported metal particles

Jingyue Liu, G. G. Hembree, G. E. Spinnler, J. A. Venables

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

High spatial resolution Auger electron spectra and images of supported metal particles have been obtained in a UHV scanning transmission electron microscope. An edge resolution < 3 nm has been achieved. The number of atoms in a small particle can be estimated from the integrated intensity of the Auger electrons. This method is very useful for detecting and measuring particles with sizes smaller than the incident probe size. Ag clusters containing less than 20 atoms have been detected when supported on a thin carbon film.

Original languageEnglish (US)
Pages (from-to)133-143
Number of pages11
JournalCatalysis Letters
Volume15
Issue number1-2
DOIs
StatePublished - Mar 1992

Fingerprint

metal particles
Metals
Imaging techniques
Atoms
Electrons
Carbon films
high resolution
atoms
electrons
Electron microscopes
electron microscopes
spatial resolution
Scanning
Thin films
scanning
probes
carbon

Keywords

  • Auger electron imaging
  • Auger electron spectroscopy
  • small particles
  • supported catalysts

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Catalysis

Cite this

High resolution Auger electron imaging of supported metal particles. / Liu, Jingyue; Hembree, G. G.; Spinnler, G. E.; Venables, J. A.

In: Catalysis Letters, Vol. 15, No. 1-2, 03.1992, p. 133-143.

Research output: Contribution to journalArticle

Liu, J, Hembree, GG, Spinnler, GE & Venables, JA 1992, 'High resolution Auger electron imaging of supported metal particles', Catalysis Letters, vol. 15, no. 1-2, pp. 133-143. https://doi.org/10.1007/BF00770906
Liu, Jingyue ; Hembree, G. G. ; Spinnler, G. E. ; Venables, J. A. / High resolution Auger electron imaging of supported metal particles. In: Catalysis Letters. 1992 ; Vol. 15, No. 1-2. pp. 133-143.
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