Abstract

One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.

Original languageEnglish (US)
Pages34-44
Number of pages11
Volume34
No3
Specialist publicationPhysics Today
DOIs
StatePublished - 1981

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electron microscopy
high resolution
rays
electron beams
electrons
x rays

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

High-resolution analytical electron microscopy. / Carpenter, Ray.

In: Physics Today, Vol. 34, No. 3, 1981, p. 34-44.

Research output: Contribution to specialist publicationArticle

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