Abstract

One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.

Original languageEnglish (US)
Pages34-44
Number of pages11
Volume34
No3
Specialist publicationPhysics Today
DOIs
StatePublished - 1981

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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