High-resolution analytical electron microscopy

Ray Carpenter

doi:10.1063/1.2914468

High-resolution analytical electron microscopy

Ray Carpenter

Research output: Contribution to specialist publication › Article

2 Scopus citations

Abstract

One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.

Original language	English (US)
Pages	34-44
Number of pages	11
Volume	34
No	3
Specialist publication	Physics Today
DOIs	https://doi.org/10.1063/1.2914468
State	Published - Mar 1981

ASJC Scopus subject areas

General Physics and Astronomy

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10.1063/1.2914468

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@misc{4e7c930ba268426a95ea697ff1062f18,

title = "High-resolution analytical electron microscopy",

abstract = "One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.",

author = "Ray Carpenter",

note = "Funding Information: Much of the research discussed here has been supported by the National Science Foundation under Grant No. CHE-7916098. The author wishes to thank Drs. D. Wittry and I. Chan for useful discussion.",

year = "1981",

month = mar,

doi = "10.1063/1.2914468",

language = "English (US)",

volume = "34",

pages = "34--44",

journal = "Physics Today",

issn = "0031-9228",

publisher = "American Institute of Physics Publising LLC",

}

TY - GEN

T1 - High-resolution analytical electron microscopy

AU - Carpenter, Ray

N1 - Funding Information: Much of the research discussed here has been supported by the National Science Foundation under Grant No. CHE-7916098. The author wishes to thank Drs. D. Wittry and I. Chan for useful discussion.

PY - 1981/3

Y1 - 1981/3

N2 - One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.

AB - One can use elastically and inelastically scattered electrons and x rays from a sample illuminated by an electron beam to determine the composition and structure of extremely small regions of the sample.

UR - http://www.scopus.com/inward/record.url?scp=84953681561&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84953681561&partnerID=8YFLogxK

U2 - 10.1063/1.2914468

DO - 10.1063/1.2914468

M3 - Article

AN - SCOPUS:84953681561

SN - 0031-9228

VL - 34

SP - 34

EP - 44

JO - Physics Today

JF - Physics Today

ER -

High-resolution analytical electron microscopy

Abstract

ASJC Scopus subject areas

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