High real-space resolution measurement of the local structure of Ga1-xInxAs using X-Ray diffraction

V. Petkov, I. K. Jeong, J. S. Chung, M. F. Thorpe, S. Kycia, S. J.L. Billinge

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Abstract

High real-space resolution atomic pair distribution functions PDFs from the alloy series Ga1-xlnxAs have been obtained using high-energy x-ray diffraction. The first peak in the PDF is resolved as a doublet due to the presence of two nearest neighbor bond lengths, Ga-As and In-As, as previously observed using x-ray absorption fine structure. The widths of nearest, and higher, neighbor PDF peaks are analyzed by separating the broadening due to static atom displacements from the thermal motion. The PDF peak width is 5 times larger for distant atomic neighbors than for nearest neighbors. The results are in agreement with model calculations.

Original languageEnglish (US)
Pages (from-to)4089-4092
Number of pages4
JournalPhysical Review Letters
Volume83
Issue number20
DOIs
StatePublished - Jan 1 1999

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ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Petkov, V., Jeong, I. K., Chung, J. S., Thorpe, M. F., Kycia, S., & Billinge, S. J. L. (1999). High real-space resolution measurement of the local structure of Ga1-xInxAs using X-Ray diffraction. Physical Review Letters, 83(20), 4089-4092. https://doi.org/10.1103/PhysRevLett.83.4089