High pressure x-ray diffraction measurements on Mg2SiO 4 glass

C. J. Benmore, E. Soignard, M. Guthrie, S. A. Amin, J. K R Weber, K. McKiernan, M. C. Wilding, Jeffery Yarger

Research output: Contribution to journalArticle

13 Citations (Scopus)

Abstract

The structure factors of Mg2SiO4 glass have been measured using high energy x-ray diffraction up to pressures of 30.2 GPa, and the equation of state measured up to 12.8 GPa. The average Mg-O coordination numbers were extracted from the experimental pair distribution functions assuming two cases (i) there is no change in Si-O coordination number with pressure and (ii) the average Si-O coordination number increases the same as for pure SiO2 glass. Both analyses give similar results and show a gradual increase in the average Mg-O coordination number from 5.0 at ambient pressure to ∼ 6.6(6) at 30.2 GPa. There is good qualitative agreement between the experimental structure and equation of state data for the glass compared to several recent molecular dynamics simulations carried out on liquid Mg2SiO4.

Original languageEnglish (US)
Pages (from-to)2632-2636
Number of pages5
JournalJournal of Non-Crystalline Solids
Volume357
Issue number14
DOIs
StatePublished - Jul 1 2011

Fingerprint

coordination number
x ray diffraction
Diffraction
Equations of state
X rays
Glass
glass
equations of state
Distribution functions
Molecular dynamics
distribution functions
Computer simulation
Liquids
molecular dynamics
liquids
forsterite
simulation
energy

Keywords

  • Equation of state
  • Glass structure
  • High pressure
  • Silicate glass
  • X-ray diffraction

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Benmore, C. J., Soignard, E., Guthrie, M., Amin, S. A., Weber, J. K. R., McKiernan, K., ... Yarger, J. (2011). High pressure x-ray diffraction measurements on Mg2SiO 4 glass. Journal of Non-Crystalline Solids, 357(14), 2632-2636. https://doi.org/10.1016/j.jnoncrysol.2010.12.064

High pressure x-ray diffraction measurements on Mg2SiO 4 glass. / Benmore, C. J.; Soignard, E.; Guthrie, M.; Amin, S. A.; Weber, J. K R; McKiernan, K.; Wilding, M. C.; Yarger, Jeffery.

In: Journal of Non-Crystalline Solids, Vol. 357, No. 14, 01.07.2011, p. 2632-2636.

Research output: Contribution to journalArticle

Benmore, CJ, Soignard, E, Guthrie, M, Amin, SA, Weber, JKR, McKiernan, K, Wilding, MC & Yarger, J 2011, 'High pressure x-ray diffraction measurements on Mg2SiO 4 glass', Journal of Non-Crystalline Solids, vol. 357, no. 14, pp. 2632-2636. https://doi.org/10.1016/j.jnoncrysol.2010.12.064
Benmore CJ, Soignard E, Guthrie M, Amin SA, Weber JKR, McKiernan K et al. High pressure x-ray diffraction measurements on Mg2SiO 4 glass. Journal of Non-Crystalline Solids. 2011 Jul 1;357(14):2632-2636. https://doi.org/10.1016/j.jnoncrysol.2010.12.064
Benmore, C. J. ; Soignard, E. ; Guthrie, M. ; Amin, S. A. ; Weber, J. K R ; McKiernan, K. ; Wilding, M. C. ; Yarger, Jeffery. / High pressure x-ray diffraction measurements on Mg2SiO 4 glass. In: Journal of Non-Crystalline Solids. 2011 ; Vol. 357, No. 14. pp. 2632-2636.
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