Abstract

The fabrication of a thin film optoelectronic device involves the exposure of the transparent conductive oxide (TCO) to a high process temperature. Indium gallium zinc oxide (InGaZnCO4 or IGZO) is a well known TCO with high optical transparency, moderate conductivity and high mobility. However, its electrical properties deteriorate after subsequent high temperature processes in air atmosphere. On the other hand indium tin oxide (ITO) has higher conductivity than IGZO and better thermal stability. Therefore, IGZO/ITO bilayers have been deposited on glass by radio frequency magnetron sputtering at room temperature and subsequently annealed at high temperatures in order to study their thermal stability. In the present work, a-IGZO layers with a thickness ranging from 10 nm to 100 nm were deposited over a 50 nm thick ITO layer. Results are compared with those from a single IGZO layered thin film without the ITO bottom layer. The structural optical and electrical properties of the multilayers are studied with the use of scanning electron microscopy, UV-Vis spectroscopy and Hall measurement. An IGZO optimal thickness of 50 nm is found to improve the bilayer thermal stability at temperatures upto 400°C keeping good opto-electrical properties. The sheet resistance for the optimized IGZO/ITO composite films is about 22 Ohm/sq, and the transmittance in the visible range is about 90%. The composite shows an excellent mobility above 40 cm2/V-s and thus can be potentially applied as channel layer in thin film transistors (TFTs)

Original languageEnglish (US)
Title of host publicationMaterials Research Society Symposium Proceedings
PublisherMaterials Research Society
Pages54-59
Number of pages6
Volume1577
ISBN (Print)9781632661562
DOIs
StatePublished - 2013
Event2013 MRS Spring Meeting - San Francisco, CA, United States
Duration: Apr 1 2013Apr 5 2013

Other

Other2013 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period4/1/134/5/13

Fingerprint

Tin oxides
indium oxides
Indium
tin oxides
Thermodynamic stability
thermal stability
Electrodes
composite materials
electrodes
Composite materials
Electric properties
electrical properties
Oxides
Temperature
thin films
Zinc Oxide
gallium oxides
Thin films
conductivity
Gallium

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

Cite this

Dhar, A., & Alford, T. (2013). High mobility IGZO/ITO double-layered transparent composite electrode: A thermal stability study. In Materials Research Society Symposium Proceedings (Vol. 1577, pp. 54-59). Materials Research Society. https://doi.org/10.1557/opl.2013.662

High mobility IGZO/ITO double-layered transparent composite electrode : A thermal stability study. / Dhar, Aritra; Alford, Terry.

Materials Research Society Symposium Proceedings. Vol. 1577 Materials Research Society, 2013. p. 54-59.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Dhar, A & Alford, T 2013, High mobility IGZO/ITO double-layered transparent composite electrode: A thermal stability study. in Materials Research Society Symposium Proceedings. vol. 1577, Materials Research Society, pp. 54-59, 2013 MRS Spring Meeting, San Francisco, CA, United States, 4/1/13. https://doi.org/10.1557/opl.2013.662
Dhar A, Alford T. High mobility IGZO/ITO double-layered transparent composite electrode: A thermal stability study. In Materials Research Society Symposium Proceedings. Vol. 1577. Materials Research Society. 2013. p. 54-59 https://doi.org/10.1557/opl.2013.662
Dhar, Aritra ; Alford, Terry. / High mobility IGZO/ITO double-layered transparent composite electrode : A thermal stability study. Materials Research Society Symposium Proceedings. Vol. 1577 Materials Research Society, 2013. pp. 54-59
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