High ionizing dose effects on ultra thin SiO 2/Si structures revealed by Conductive Atomic Force Microscopy

R. Arinero, A. D. Touboul, M. Ramonda, C. Guasch, Y. Gonzalez-Velo, J. Boch, F. Saigné

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Physics & Astronomy

Engineering & Materials Science