High energy and spatial resolution EELS band gap measurements using a nion monochromated cold field emission HERMES dedicated STEM

Ray Carpenter, H. Xie, S. Lehner, T. Aoki, J. Mardinly, M. Vahidi, Nathan Newman, Fernando Ponce

Research output: Contribution to journalConference articlepeer-review

2 Scopus citations
Original languageEnglish (US)
Pages (from-to)70-71
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

ASJC Scopus subject areas

  • Instrumentation

Cite this