High efficiency Inverted Metamorphic (IMM) solar cells

J. Boisvert, D. Law, R. King, E. Rehder, P. Chiu, D. Bhusari, C. Fetzer, X. Liu, W. Hong, S. Mesropian, R. Woo, K. Edmondson, H. Cotal, D. Krut, S. Singer, S. Wierman, N. H. Karam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations

Abstract

High efficiency Inverted Metamorphic (IMM) multi-junction solar cells have been under development at Spectrolab for use in space and near space applications This paper reviews the present state-of-the-art of this technology at Spectrolab with an emphasis on performance characterization data at in-flight operating conditions. Large area IMM3J and IMM4J solar cells with 1X AM0 efficiency greater than 32% at 28°C have been fabricated and characterized. Degradation factors after exposure to 1 MeV electron irradiation for both IMM3J and IMM4J technologies is presented. A coupon utilizing large area, IMM solar cells has been assembled and subjected to thermal cycling. Pre-and post thermal cycling data have been collected. Preliminary temperature cycling data indicate that a small coupon populated with strings of these cells suffered no degradation.

Original languageEnglish (US)
Title of host publication39th IEEE Photovoltaic Specialists Conference, PVSC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2790-2792
Number of pages3
ISBN (Print)9781479932993
DOIs
StatePublished - Jan 1 2013
Externally publishedYes
Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
Duration: Jun 16 2013Jun 21 2013

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Other

Other39th IEEE Photovoltaic Specialists Conference, PVSC 2013
CountryUnited States
CityTampa, FL
Period6/16/136/21/13

Keywords

  • IMM
  • Multi-junction
  • Photovoltaic
  • Space

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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