HAADF studies of the Si3N4 IGF interface

D. J.H. Cockayne, G. Winkelman, C. Dwyer, M. Döblinger

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)136-137
Number of pages2
JournalMicroscopy and Microanalysis
Issue numberSUPPL. 2
StatePublished - Aug 1 2006
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

Cite this

Cockayne, D. J. H., Winkelman, G., Dwyer, C., & Döblinger, M. (2006). HAADF studies of the Si3N4 IGF interface. Microscopy and Microanalysis, 12(SUPPL. 2), 136-137. https://doi.org/10.1017/S1431927606069303