HAADF studies of the Si3N4 IGF interface

D. J H Cockayne, G. Winkelman, Christian Dwyer, M. Döblinger

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)136-137
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 2006
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

Cite this

Cockayne, D. J. H., Winkelman, G., Dwyer, C., & Döblinger, M. (2006). HAADF studies of the Si3N4 IGF interface. Microscopy and Microanalysis, 12(SUPPL. 2), 136-137. https://doi.org/10.1017/S1431927606069303

HAADF studies of the Si3N4 IGF interface. / Cockayne, D. J H; Winkelman, G.; Dwyer, Christian; Döblinger, M.

In: Microscopy and Microanalysis, Vol. 12, No. SUPPL. 2, 08.2006, p. 136-137.

Research output: Contribution to journalArticle

Cockayne, DJH, Winkelman, G, Dwyer, C & Döblinger, M 2006, 'HAADF studies of the Si3N4 IGF interface', Microscopy and Microanalysis, vol. 12, no. SUPPL. 2, pp. 136-137. https://doi.org/10.1017/S1431927606069303
Cockayne, D. J H ; Winkelman, G. ; Dwyer, Christian ; Döblinger, M. / HAADF studies of the Si3N4 IGF interface. In: Microscopy and Microanalysis. 2006 ; Vol. 12, No. SUPPL. 2. pp. 136-137.
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