HAADF studies of the Si3N4 IGF interface

D. J.H. Cockayne; G. Winkelman; C. Dwyer; M. Döblinger

doi:10.1017/S1431927606069303

HAADF studies of the Si₃N₄ IGF interface

D. J.H. Cockayne, G. Winkelman, C. Dwyer, M. Döblinger

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	136-137
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	12
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927606069303
State	Published - Aug 2006
Externally published	Yes

ASJC Scopus subject areas

Instrumentation

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Cite this

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title = "HAADF studies of the Si3N4 IGF interface",

author = "Cockayne, {D. J.H.} and G. Winkelman and C. Dwyer and M. D{\"o}blinger",

year = "2006",

month = aug,

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language = "English (US)",

volume = "12",

pages = "136--137",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

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TY - JOUR

T1 - HAADF studies of the Si3N4 IGF interface

AU - Cockayne, D. J.H.

AU - Winkelman, G.

AU - Dwyer, C.

AU - Döblinger, M.

PY - 2006/8

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DO - 10.1017/S1431927606069303

M3 - Article

AN - SCOPUS:33750890625

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SP - 136

EP - 137

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

HAADF studies of the Si3N4 IGF interface

ASJC Scopus subject areas

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HAADF studies of the Si₃N₄ IGF interface