Guided wave based inspection of integrated circuit packages using the time-frequency synchrosqueezing transform

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Ultrasonic guided waves have the potential to inspect integrated circuit (IC) packages using wave based techniques due to excellent sub surface penetration through metallic as well as dielectric material. Guided waves in a heterogeneous composite assembly such as an IC package have modes with complex dispersion characteristics due to multiple layers of material with intricate geometry. No analytical solution exists for predicting dispersion in highly anisotropic composites. Numerical methods, such as the finite element method, have been used to model dispersion in composites, however these methods are computationally intensive and not feasible for predicting dispersion in IC packages. In this paper, the time-frequency characteristics of guided waves propagating through a complex IC are studied using the synchrosqueezing transform (SST). This is a transform that has been shown to be robust to bounded signal perturbations, to provide highly localized time and frequency information for highly nonlinear modes, and to reconstruct the signal corresponding to each mode. Reference ultrasonic guided wave signals are collected for the IC package in its healthy and damaged states using piezoelectric transducers to characterize the dispersion modes in the excitation region. Initial results demonstrate that the dispersive mode information from the extracted SST ridges provide an effective damage indicator for IC packaging.

Original languageEnglish (US)
Title of host publicationSmart Structures and NDE for Energy Systems and Industry 4.0
EditorsChristopher Niezrecki, Kerrie Gath, Norbert G. Meyendorf
PublisherSPIE
ISBN (Electronic)9781510626010
DOIs
StatePublished - Jan 1 2019
EventSmart Structures and NDE for Energy Systems and Industry 4.0 2019 - Denver, United States
Duration: Mar 4 2019Mar 5 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10973
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceSmart Structures and NDE for Energy Systems and Industry 4.0 2019
CountryUnited States
CityDenver
Period3/4/193/5/19

Fingerprint

Guided Waves
Guided electromagnetic wave propagation
Integrated Circuits
integrated circuits
Integrated circuits
Inspection
inspection
Transform
Ultrasonic Wave
Ultrasonic waves
Composite
composite materials
Composite materials
ultrasonics
Piezoelectric transducers
piezoelectric transducers
Packaging
Ridge
Transducer
packaging

Keywords

  • dispersive mode
  • guided wave propagation
  • Integrated circuit packaging
  • synchrosqueezing transform.
  • time-frequency processing

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Ikram, J., Papandreou-Suppappola, A., Li, G., & Chattopadhyay, A. (2019). Guided wave based inspection of integrated circuit packages using the time-frequency synchrosqueezing transform. In C. Niezrecki, K. Gath, & N. G. Meyendorf (Eds.), Smart Structures and NDE for Energy Systems and Industry 4.0 [109730A] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10973). SPIE. https://doi.org/10.1117/12.2504207

Guided wave based inspection of integrated circuit packages using the time-frequency synchrosqueezing transform. / Ikram, Javaid; Papandreou-Suppappola, Antonia; Li, Guoyi; Chattopadhyay, Aditi.

Smart Structures and NDE for Energy Systems and Industry 4.0. ed. / Christopher Niezrecki; Kerrie Gath; Norbert G. Meyendorf. SPIE, 2019. 109730A (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10973).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ikram, J, Papandreou-Suppappola, A, Li, G & Chattopadhyay, A 2019, Guided wave based inspection of integrated circuit packages using the time-frequency synchrosqueezing transform. in C Niezrecki, K Gath & NG Meyendorf (eds), Smart Structures and NDE for Energy Systems and Industry 4.0., 109730A, Proceedings of SPIE - The International Society for Optical Engineering, vol. 10973, SPIE, Smart Structures and NDE for Energy Systems and Industry 4.0 2019, Denver, United States, 3/4/19. https://doi.org/10.1117/12.2504207
Ikram J, Papandreou-Suppappola A, Li G, Chattopadhyay A. Guided wave based inspection of integrated circuit packages using the time-frequency synchrosqueezing transform. In Niezrecki C, Gath K, Meyendorf NG, editors, Smart Structures and NDE for Energy Systems and Industry 4.0. SPIE. 2019. 109730A. (Proceedings of SPIE - The International Society for Optical Engineering). https://doi.org/10.1117/12.2504207
Ikram, Javaid ; Papandreou-Suppappola, Antonia ; Li, Guoyi ; Chattopadhyay, Aditi. / Guided wave based inspection of integrated circuit packages using the time-frequency synchrosqueezing transform. Smart Structures and NDE for Energy Systems and Industry 4.0. editor / Christopher Niezrecki ; Kerrie Gath ; Norbert G. Meyendorf. SPIE, 2019. (Proceedings of SPIE - The International Society for Optical Engineering).
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