Guest editors' introduction: Reliability challenges in nano-CMOS design

Yu Cao, Pradip Bose, Jim Tschanz

Research output: Contribution to journalEditorialpeer-review

18 Scopus citations
Original languageEnglish (US)
Pages (from-to)6-7
Number of pages2
JournalIEEE Design and Test of Computers
Volume26
Issue number6
DOIs
StatePublished - Dec 1 2009

ASJC Scopus subject areas

  • Software
  • Hardware and Architecture
  • Electrical and Electronic Engineering

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