Guest editors' introduction: Reliability challenges in nano-CMOS design

Yu Cao; Pradip Bose; Jim Tschanz

doi:10.1109/MDT.2009.149

Guest editors' introduction: Reliability challenges in nano-CMOS design

Yu Cao, Pradip Bose, Jim Tschanz

Research output: Contribution to journal › Editorial › peer-review

Original language	English (US)
Pages (from-to)	6-7
Number of pages	2
Journal	IEEE Design and Test of Computers
Volume	26
Issue number	6
DOIs	https://doi.org/10.1109/MDT.2009.149
State	Published - 2009

ASJC Scopus subject areas

Software
Hardware and Architecture
Electrical and Electronic Engineering

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10.1109/MDT.2009.149

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title = "Guest editors' introduction: Reliability challenges in nano-CMOS design",

author = "Yu Cao and Pradip Bose and Jim Tschanz",

year = "2009",

doi = "10.1109/MDT.2009.149",

language = "English (US)",

volume = "26",

pages = "6--7",

journal = "IEEE Design and Test of Computers",

issn = "0740-7475",

publisher = "IEEE Computer Society",

number = "6",

}

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AU - Bose, Pradip

AU - Tschanz, Jim

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EP - 7

JO - IEEE Design and Test of Computers

JF - IEEE Design and Test of Computers

IS - 6

ER -

Guest editors' introduction: Reliability challenges in nano-CMOS design

ASJC Scopus subject areas

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