Guest editors' introduction: Compact variability modeling in scaled CMOS design

Yu Cao, Frank Liu

Research output: Contribution to journalArticle

Original languageEnglish (US)
Article number5432317
Pages (from-to)6-7
Number of pages2
JournalIEEE Design and Test of Computers
Volume27
Issue number2
DOIs
StatePublished - Mar 2010

ASJC Scopus subject areas

  • Hardware and Architecture
  • Software
  • Electrical and Electronic Engineering

Cite this

Guest editors' introduction : Compact variability modeling in scaled CMOS design. / Cao, Yu; Liu, Frank.

In: IEEE Design and Test of Computers, Vol. 27, No. 2, 5432317, 03.2010, p. 6-7.

Research output: Contribution to journalArticle

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