Guaranteed fault detection and isolation for switched affine models

Farshad Harirchi, Sze Yong, Yong Necmiye Ozay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper considers the problem of fault detection and isolation (FDI) for switched affine models. We first study the model invalidation problem and its application to guaranteed fault detection. Novel and intuitive optimization-based formulations are proposed for model invalidation and T-distinguishability problems, which we demonstrate to be computationally more efficient than an earlier formulation that required a complicated change of variables. Moreover, we introduce a distinguishability index as a measure of separation between the system and fault models, which offers a practical method for finding the smallest receding time horizon that is required for fault detection, and for finding potential design recommendations for ensuring T-distinguishability. Then, we extend our fault detection guarantees to the problem of fault isolation with multiple fault models, i.e., the identification of the type and location of faults, by introducing the concept of I-isolability. An efficient way to implement the FDI scheme is also proposed, whose run-time does not grow with the number of fault models that are considered. Moreover, we derive bounds on detection and isolation delays and present an adaptive scheme for reducing isolation delays. Finally, the effectiveness of the proposed method is illustrated using several examples, including an HVAC system model with multiple faults.

Original languageEnglish (US)
Title of host publication2017 IEEE 56th Annual Conference on Decision and Control, CDC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages5161-5167
Number of pages7
Volume2018-January
ISBN (Electronic)9781509028733
DOIs
StatePublished - Jan 18 2018
Event56th IEEE Annual Conference on Decision and Control, CDC 2017 - Melbourne, Australia
Duration: Dec 12 2017Dec 15 2017

Other

Other56th IEEE Annual Conference on Decision and Control, CDC 2017
CountryAustralia
CityMelbourne
Period12/12/1712/15/17

Fingerprint

Fault Detection and Isolation
Fault detection
Fault
Fault Detection
Isolation
Model
Fault Isolation
Formulation
Change of Variables
Affine model
Horizon
Intuitive
Recommendations
Identification (control systems)
Optimization
Demonstrate

ASJC Scopus subject areas

  • Decision Sciences (miscellaneous)
  • Industrial and Manufacturing Engineering
  • Control and Optimization

Cite this

Harirchi, F., Yong, S., & Ozay, Y. N. (2018). Guaranteed fault detection and isolation for switched affine models. In 2017 IEEE 56th Annual Conference on Decision and Control, CDC 2017 (Vol. 2018-January, pp. 5161-5167). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CDC.2017.8264424

Guaranteed fault detection and isolation for switched affine models. / Harirchi, Farshad; Yong, Sze; Ozay, Yong Necmiye.

2017 IEEE 56th Annual Conference on Decision and Control, CDC 2017. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. p. 5161-5167.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harirchi, F, Yong, S & Ozay, YN 2018, Guaranteed fault detection and isolation for switched affine models. in 2017 IEEE 56th Annual Conference on Decision and Control, CDC 2017. vol. 2018-January, Institute of Electrical and Electronics Engineers Inc., pp. 5161-5167, 56th IEEE Annual Conference on Decision and Control, CDC 2017, Melbourne, Australia, 12/12/17. https://doi.org/10.1109/CDC.2017.8264424
Harirchi F, Yong S, Ozay YN. Guaranteed fault detection and isolation for switched affine models. In 2017 IEEE 56th Annual Conference on Decision and Control, CDC 2017. Vol. 2018-January. Institute of Electrical and Electronics Engineers Inc. 2018. p. 5161-5167 https://doi.org/10.1109/CDC.2017.8264424
Harirchi, Farshad ; Yong, Sze ; Ozay, Yong Necmiye. / Guaranteed fault detection and isolation for switched affine models. 2017 IEEE 56th Annual Conference on Decision and Control, CDC 2017. Vol. 2018-January Institute of Electrical and Electronics Engineers Inc., 2018. pp. 5161-5167
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