Abstract
Growth of GaN by metal-organic vapor phase epitaxy (MOVPE) on metallic zirconium diboride (ZrB 2 ) substrate was investigated. Cross-sectional transmission electron microscopy (TEM) showed that cubic ZrB x N 1-x is formed on the surface when ZrB 2 is exposed to ammonia-containing atmosphere, which protects the nucleation of GaN or AlN. We solved the problem by covering ZrB 2 surface with very thin AlN or GaN at low temperature, thereby achieving high-quality GaN growth with a dislocation density less than 10 8 cm -2 . Direct conduction was achieved through the back of ZrB 2 and the surface of Si-doped GaN.
Original language | English (US) |
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Pages (from-to) | 502-507 |
Number of pages | 6 |
Journal | Applied Surface Science |
Volume | 216 |
Issue number | 1-4 SPEC. |
DOIs | |
State | Published - Jun 30 2003 |
Keywords
- GaN
- MOVPE
- New substrate
- Nitridation
- ZrB
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- General Physics and Astronomy
- Surfaces and Interfaces
- Surfaces, Coatings and Films