Growth of GaAs on Polycrystalline Germanium Substrates Prepared via Aluminum-Induced Crystallization

Elisabeth L. McClure, Stephen J. Polly, Abhinav Chikhalkar, Richard King, Seth M. Hubbard

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Polycrystalline germanium substrates with an average grain size >600 nm have been achieved on silicon substrates with 500 nm thermally grown silicon dioxide, using a process called aluminum-induced crystallization. Double heterostructures were grown by metal-organic vapor phase epitaxy on these polycrystalline germanium substrates, as well as commercial large-grain polycrystalline germanium substrates and monocrystalline germanium substrate as baselines. Four temperatures were explored for the gallium arsenide nucleation layer in the double heterostructure, with all other growth conditions remaining constant.

Original languageEnglish (US)
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages224-228
Number of pages5
ISBN (Electronic)9781538685297
DOIs
StatePublished - Nov 26 2018
Event7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States
Duration: Jun 10 2018Jun 15 2018

Other

Other7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
CountryUnited States
CityWaikoloa Village
Period6/10/186/15/18

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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    McClure, E. L., Polly, S. J., Chikhalkar, A., King, R., & Hubbard, S. M. (2018). Growth of GaAs on Polycrystalline Germanium Substrates Prepared via Aluminum-Induced Crystallization. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - A Joint Conference of 45th IEEE PVSC, 28th PVSEC and 34th EU PVSEC (pp. 224-228). [8547654] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2018.8547654