Growth of Cu(In, Ga)(S, Se)2 films: Unravelling the mysteries by in-situ X-ray imaging

Bradley West; Michael Stuckelberger; Lei Chen; Robert Lovelett; Barry Lai; Jorg Maser; William Shafarman; Mariana Bertoni

doi:10.1109/PVSC.2016.7749650

Growth of Cu(In, Ga)(S, Se)₂ films: Unravelling the mysteries by in-situ X-ray imaging

Bradley West, Michael Stuckelberger, Lei Chen, Robert Lovelett, Barry Lai, Jorg Maser, William Shafarman, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

5 Scopus citations

Abstract

In-situ investigations of Cu(In, Ga)(S, Se)₂ (CIGS) absorber layers during growth have the potential to provide insight into the origin behind elemental segregation and defect formation at grain boundaries and in grain cores. Our study focuses on CIGS films grown by an industrially relevant precursor reaction process. An in-situ stage developed for these synchrotron studies is used to image the growth of CIGS layers with nanoscale resolution. Utilizing synchrotron based x-ray fluorescence, we are able to rapidly monitor changes in elemental distribution and particle diffusion, with better than 200 nm spatial resolution throughout the 25 minute process. In this work, we highlight some challenges associated with this type of measurements and discuss solutions identified to overcome them.

Original language	English (US)
Title of host publication	2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	530-533
Number of pages	4
ISBN (Electronic)	9781509027248
DOIs	https://doi.org/10.1109/PVSC.2016.7749650
State	Published - Nov 18 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: Jun 5 2016 → Jun 10 2016

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
Volume	2016-November
ISSN (Print)	0160-8371

Other

Other	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	6/5/16 → 6/10/16

Keywords

CIGS
XRF
growth
in-situ
synchrotron

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC.2016.7749650

Cite this

West, B., Stuckelberger, M., Chen, L., Lovelett, R., Lai, B., Maser, J., Shafarman, W., & Bertoni, M. (2016). Growth of Cu(In, Ga)(S, Se)₂ films: Unravelling the mysteries by in-situ X-ray imaging. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016 (pp. 530-533). Article 7749650 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2016-November). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2016.7749650

Growth of Cu(In, Ga)(S, Se)₂ films: Unravelling the mysteries by in-situ X-ray imaging. / West, Bradley; Stuckelberger, Michael; Chen, Lei et al.
2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 530-533 7749650 (Conference Record of the IEEE Photovoltaic Specialists Conference; Vol. 2016-November).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

West, B, Stuckelberger, M, Chen, L, Lovelett, R, Lai, B, Maser, J, Shafarman, W & Bertoni, M 2016, Growth of Cu(In, Ga)(S, Se)₂ films: Unravelling the mysteries by in-situ X-ray imaging. in 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016., 7749650, Conference Record of the IEEE Photovoltaic Specialists Conference, vol. 2016-November, Institute of Electrical and Electronics Engineers Inc., pp. 530-533, 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 6/5/16. https://doi.org/10.1109/PVSC.2016.7749650

West B, Stuckelberger M, Chen L, Lovelett R, Lai B, Maser J et al. Growth of Cu(In, Ga)(S, Se)₂ films: Unravelling the mysteries by in-situ X-ray imaging. In 2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 530-533. 7749650. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC.2016.7749650

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