Growth and characterization of bulk crystals, thin films and patterned structures of AlN, GaN and Al xGa 1-xN on SiC(0001) substrates and device-related research

Robert F. Davis, C. M. Balkas, L. Bergman, M. D. Bremser, O. H. Nam, W. G. Perry, I. Shmagin, Z. Sitar, B. L. Ward, T. Zheleva, R. Kolbas, Robert Nemanich

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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Engineering & Materials Science

Physics & Astronomy