Abstract
A study was performed on the gate voltage dependence of the low-field electron mobility in a In0.53Ga0.47As/In0.52Al0.48As modulation-doped heterostructures. The Green's function approach was used for the transport calculation of the heterostructures. The mobility results for the structure revealed that alloy-disorder scattering was the dominant degradation mechanism.
Original language | English (US) |
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Pages (from-to) | 3359-3363 |
Number of pages | 5 |
Journal | Journal of Applied Physics |
Volume | 93 |
Issue number | 6 |
DOIs | |
State | Published - Mar 15 2003 |
ASJC Scopus subject areas
- Physics and Astronomy(all)