Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping

Ehsan Izadi, Amith Darbal, Rohit Sarkar, Jagannathan Rajagopalan

Research output: Contribution to journalArticle

  • 6 Citations

Abstract

In situ TEM straining allows probing deformation mechanisms of ultrafine-grained and nanocrystalline metals. While obtaining statistically meaningful information about microstructural changes using conventional bright-field/dark-field imaging or diffraction is time consuming, automated crystal orientation mapping in TEM (ACOM-TEM) enables tracking orientation changes of hundreds of grains simultaneously. We use this technique to uncover extensive grain rotations during in situ tensile deformation of a freestanding, ultrafine-grained aluminum film (thickness 200 nm, mean grain size 180 nm). During loading, both the fraction of grains that undergo rotations and the magnitude of their rotations increase with strain. The rotations are partially or fully reversible in a significant fraction of grains during unloading, leading to notable inelastic strain recovery. More surprisingly, the direction of rotation remains unchanged for a small fraction of grains during unloading, despite a sharp reduction in the applied stress. The ACOM-TEM measurements also provide evidence of reversible and irreversible grain/twin boundary migrations in the film. These microstructural observations point to a highly inhomogeneous and constantly evolving stress distribution in the film during both loading and unloading.

LanguageEnglish (US)
Pages186-194
Number of pages9
JournalMaterials and Design
Volume113
DOIs
StatePublished - Jan 5 2017

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Aluminum
Crystal orientation
Transmission electron microscopy
Unloading
Film thickness
Stress concentration
Grain boundaries
Diffraction
Metals
Ultrafine
Imaging techniques
Recovery

Keywords

  • Automated crystal orientation map
  • Bauschinger effect
  • Detwinning
  • Grain boundary migration
  • In situ TEM
  • Reversible grain rotation

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping. / Izadi, Ehsan; Darbal, Amith; Sarkar, Rohit; Rajagopalan, Jagannathan.

In: Materials and Design, Vol. 113, 05.01.2017, p. 186-194.

Research output: Contribution to journalArticle

@article{910e8376b1c04a4b9ed7b69bd530b794,
title = "Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping",
abstract = "In situ TEM straining allows probing deformation mechanisms of ultrafine-grained and nanocrystalline metals. While obtaining statistically meaningful information about microstructural changes using conventional bright-field/dark-field imaging or diffraction is time consuming, automated crystal orientation mapping in TEM (ACOM-TEM) enables tracking orientation changes of hundreds of grains simultaneously. We use this technique to uncover extensive grain rotations during in situ tensile deformation of a freestanding, ultrafine-grained aluminum film (thickness 200 nm, mean grain size 180 nm). During loading, both the fraction of grains that undergo rotations and the magnitude of their rotations increase with strain. The rotations are partially or fully reversible in a significant fraction of grains during unloading, leading to notable inelastic strain recovery. More surprisingly, the direction of rotation remains unchanged for a small fraction of grains during unloading, despite a sharp reduction in the applied stress. The ACOM-TEM measurements also provide evidence of reversible and irreversible grain/twin boundary migrations in the film. These microstructural observations point to a highly inhomogeneous and constantly evolving stress distribution in the film during both loading and unloading.",
keywords = "Automated crystal orientation map, Bauschinger effect, Detwinning, Grain boundary migration, In situ TEM, Reversible grain rotation",
author = "Ehsan Izadi and Amith Darbal and Rohit Sarkar and Jagannathan Rajagopalan",
year = "2017",
month = "1",
day = "5",
doi = "10.1016/j.matdes.2016.10.015",
language = "English (US)",
volume = "113",
pages = "186--194",
journal = "Materials and Design",
issn = "0261-3069",
publisher = "Elsevier BV",

}

TY - JOUR

T1 - Grain rotations in ultrafine-grained aluminum films studied using in situ TEM straining with automated crystal orientation mapping

AU - Izadi,Ehsan

AU - Darbal,Amith

AU - Sarkar,Rohit

AU - Rajagopalan,Jagannathan

PY - 2017/1/5

Y1 - 2017/1/5

N2 - In situ TEM straining allows probing deformation mechanisms of ultrafine-grained and nanocrystalline metals. While obtaining statistically meaningful information about microstructural changes using conventional bright-field/dark-field imaging or diffraction is time consuming, automated crystal orientation mapping in TEM (ACOM-TEM) enables tracking orientation changes of hundreds of grains simultaneously. We use this technique to uncover extensive grain rotations during in situ tensile deformation of a freestanding, ultrafine-grained aluminum film (thickness 200 nm, mean grain size 180 nm). During loading, both the fraction of grains that undergo rotations and the magnitude of their rotations increase with strain. The rotations are partially or fully reversible in a significant fraction of grains during unloading, leading to notable inelastic strain recovery. More surprisingly, the direction of rotation remains unchanged for a small fraction of grains during unloading, despite a sharp reduction in the applied stress. The ACOM-TEM measurements also provide evidence of reversible and irreversible grain/twin boundary migrations in the film. These microstructural observations point to a highly inhomogeneous and constantly evolving stress distribution in the film during both loading and unloading.

AB - In situ TEM straining allows probing deformation mechanisms of ultrafine-grained and nanocrystalline metals. While obtaining statistically meaningful information about microstructural changes using conventional bright-field/dark-field imaging or diffraction is time consuming, automated crystal orientation mapping in TEM (ACOM-TEM) enables tracking orientation changes of hundreds of grains simultaneously. We use this technique to uncover extensive grain rotations during in situ tensile deformation of a freestanding, ultrafine-grained aluminum film (thickness 200 nm, mean grain size 180 nm). During loading, both the fraction of grains that undergo rotations and the magnitude of their rotations increase with strain. The rotations are partially or fully reversible in a significant fraction of grains during unloading, leading to notable inelastic strain recovery. More surprisingly, the direction of rotation remains unchanged for a small fraction of grains during unloading, despite a sharp reduction in the applied stress. The ACOM-TEM measurements also provide evidence of reversible and irreversible grain/twin boundary migrations in the film. These microstructural observations point to a highly inhomogeneous and constantly evolving stress distribution in the film during both loading and unloading.

KW - Automated crystal orientation map

KW - Bauschinger effect

KW - Detwinning

KW - Grain boundary migration

KW - In situ TEM

KW - Reversible grain rotation

UR - http://www.scopus.com/inward/record.url?scp=84991677060&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84991677060&partnerID=8YFLogxK

U2 - 10.1016/j.matdes.2016.10.015

DO - 10.1016/j.matdes.2016.10.015

M3 - Article

VL - 113

SP - 186

EP - 194

JO - Materials and Design

T2 - Materials and Design

JF - Materials and Design

SN - 0261-3069

ER -