Abstract
Recent advances in three-dimensional, confocal imaging techniques and image analysis software allow for previously unattainable measurements in the neural environment. Specifically, relative quantitative measurements of the amount of glial fibrillary acidic protein (GFAP) surrounding a neural implant can be determined. In this study, dextran coatings have been applied to silicon neural implants. Dextran coatings have been shown to limit non-specific cell adhesion in vitro. Thus, it is believed that these coatings will limit the amount of gliosis surrounding a neural implant and ultimately improve signal-to-noise ratio. To test this hypothesis, Sprague-Dawley rats were implanted with both dextran-coated and non-dextran-coated silicon electrodes. Using immunohistochemical staining in conjunction with confocal imaging and image analysis techniques, the differences in GFAP upregulation between dextran-coated and non-treated silicon neural implants were investigated.
Original language | English (US) |
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Title of host publication | Annual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings |
Pages | 1832-1833 |
Number of pages | 2 |
Volume | 3 |
State | Published - 2002 |
Event | Proceedings of the 2002 IEEE Engineering in Medicine and Biology 24th Annual Conference and the 2002 Fall Meeting of the Biomedical Engineering Society (BMES / EMBS) - Houston, TX, United States Duration: Oct 23 2002 → Oct 26 2002 |
Other
Other | Proceedings of the 2002 IEEE Engineering in Medicine and Biology 24th Annual Conference and the 2002 Fall Meeting of the Biomedical Engineering Society (BMES / EMBS) |
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Country/Territory | United States |
City | Houston, TX |
Period | 10/23/02 → 10/26/02 |
Keywords
- Astrocyte
- Confocal
- GFAP
- Gliosis
- Imaging
- Neural
ASJC Scopus subject areas
- Bioengineering