Generalized linear model-based control charts for discrete semiconductor process data

Katina R. Skinner, Douglas Montgomery, George Runger

Research output: Contribution to journalArticlepeer-review

33 Scopus citations

Abstract

In previous simple cases generalized linear model (GLM)-based control charts have been shown to be very effective in detecting shifts in multivariate counts when input variables are measurable. This paper studies the effectiveness of GLM-based control charts on more complicated data sets with multiple inputs and outputs whose relationships are varied. Results show that the GLM-based charts were most effective in detecting changes in the means of overdispersed counts (when compared with counts with normal dispersion). The GLM-based charts were more effective than multiple C charts in detecting changes in the means of counts when multiple complicated relationships exist.

Original languageEnglish (US)
Pages (from-to)777-786
Number of pages10
JournalQuality and Reliability Engineering International
Volume20
Issue number8
DOIs
StatePublished - Dec 1 2004

Keywords

  • Generalized linear model
  • Model-based control chart
  • Overdispersion

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Management Science and Operations Research

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