A rigorous, general characteristic fluorescence correction for electron microprobe analysis of samples of given geometry has been developed, and specific versions of this equation have been formulated for calculation of the flourescence produced in thin films and spherical particles. These equations are evaluated for representative matrices having large characteristic fluorescence corrections and the results are compared with existing empirical correction equations.
|Original language||English (US)|
|Title of host publication||Proceedings, Annual Conference - Microbeam Analysis Society|
|Editors||Alton D.Jr. Romig, Joseph I. Goldstein|
|Number of pages||18|
|State||Published - 1984|
ASJC Scopus subject areas