GENERAL CHARACTERISTIC FLUORESCENCE CORRECTION FOR PARTICLES, THIN FILMS, AND THICK SPECIMENS.

J. T. Armstrong, P R Buseck

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A rigorous, general characteristic fluorescence correction for electron microprobe analysis of samples of given geometry has been developed, and specific versions of this equation have been formulated for calculation of the flourescence produced in thin films and spherical particles. These equations are evaluated for representative matrices having large characteristic fluorescence corrections and the results are compared with existing empirical correction equations.

Original languageEnglish (US)
Title of host publicationProceedings, Annual Conference - Microbeam Analysis Society
EditorsAlton D.Jr. Romig, Joseph I. Goldstein
Pages231-214
Number of pages18
StatePublished - 1984
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

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