Gated-region transport in the quantum Hall effect

J. M. Ryan, N. F. Deutscher, D. K. Ferry

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

We study the quantum Hall effect in samples in which a portion of the longitudinal conduction path is gated. Full magnetic-field sweeps were taken on a sample consisting of a gated Hall bar geometry. These data yielded plateaus in longitudinal resistance, as the gate voltage is varied, for the integer filling factor in the bulk, as previously observed, and plateaus for the case of a fixed integer number of transmitted edge states under the barrier as the gate voltage and the magnetic field are varied. For a significant portion of the Shubnikov de Haas sweeps, the barrier region dominates the characteristic conductance and Fourier analysis allows one to determine the variation of the carrier concentration in the gated region as a function of gate voltage.

Original languageEnglish (US)
Pages (from-to)8840-8847
Number of pages8
JournalPhysical Review B
Volume48
Issue number12
DOIs
StatePublished - 1993

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Quantum Hall effect
quantum Hall effect
integers
plateaus
Electric potential
electric potential
Magnetic fields
Fourier analysis
magnetic fields
Carrier concentration
conduction
Geometry
geometry

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Ryan, J. M., Deutscher, N. F., & Ferry, D. K. (1993). Gated-region transport in the quantum Hall effect. Physical Review B, 48(12), 8840-8847. https://doi.org/10.1103/PhysRevB.48.8840

Gated-region transport in the quantum Hall effect. / Ryan, J. M.; Deutscher, N. F.; Ferry, D. K.

In: Physical Review B, Vol. 48, No. 12, 1993, p. 8840-8847.

Research output: Contribution to journalArticle

Ryan, JM, Deutscher, NF & Ferry, DK 1993, 'Gated-region transport in the quantum Hall effect', Physical Review B, vol. 48, no. 12, pp. 8840-8847. https://doi.org/10.1103/PhysRevB.48.8840
Ryan, J. M. ; Deutscher, N. F. ; Ferry, D. K. / Gated-region transport in the quantum Hall effect. In: Physical Review B. 1993 ; Vol. 48, No. 12. pp. 8840-8847.
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