Fully automated, testable design of fine-grained triple mode redundant logic

Nathan D. Hindman, Lawrence T. Clark, Dan W. Patterson, Keith Holbert

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

A fully automated logic design methodology for radiation hardened by design high-speed logic using fine-grained triple modular redundancy (TMR) is presented. The methodology and circuits leverage commercial logic design automation tools. The circuit approach is validated for hardness using both heavy ion and proton broad beam testing. The base TMR self-correcting master-slave flip-flop is described, including testability features that disable the self-correction. The flow allows hardening of any synthesizable logic at clock frequencies comparable to unhardened designs and supports standard low-power techniques, e.g., clock gating and supply voltage scaling.

Original languageEnglish (US)
Article number6061925
Pages (from-to)3046-3052
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume58
Issue number6 PART 1
DOIs
StatePublished - Dec 2011

Fingerprint

logic design
Logic design
redundancy
clocks
logic
Redundancy
Clocks
methodology
flip-flops
Networks (circuits)
Flip flop circuits
automation
Heavy ions
hardening
Hardening
heavy ions
Protons
hardness
Automation
Hardness

Keywords

  • Auto-place and route
  • logic synthesis
  • radiation hardening by design
  • standard cell library

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering
  • Nuclear and High Energy Physics

Cite this

Fully automated, testable design of fine-grained triple mode redundant logic. / Hindman, Nathan D.; Clark, Lawrence T.; Patterson, Dan W.; Holbert, Keith.

In: IEEE Transactions on Nuclear Science, Vol. 58, No. 6 PART 1, 6061925, 12.2011, p. 3046-3052.

Research output: Contribution to journalArticle

Hindman, Nathan D. ; Clark, Lawrence T. ; Patterson, Dan W. ; Holbert, Keith. / Fully automated, testable design of fine-grained triple mode redundant logic. In: IEEE Transactions on Nuclear Science. 2011 ; Vol. 58, No. 6 PART 1. pp. 3046-3052.
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