Fullband Particle-Based Simulation of High-Field Transient Transport in III–V Semiconductors

S. Wigger, Marco Saraniti, Stephen Goodnick, A. Leitenstorfer

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Motivated by recent experimental measurements (A. Leitenstorfer et al., 2000. Physical Review B 61(24): 16642–16652), this work presents the transient analysis of photogenerated electron-hole pairs in GaAs and InP pin diodes (S. M. Sze, 1981. Physics of Semiconductor Devices, 2nd edn., John Wiley) using a fullband particle-based simulator (M. Saraniti and S. Goodnick, 2000. IEEE Transactions on Electron Devices 47(10): 1909–1915). The fullband simulation tool is based on a particle-based technique that has been developed to reduce the computational time required for modeling charge transport phenomena in semiconductors. Excellent agreement is found between experiment and simulation of transient acceleration and velocity overshoot in GaAs and InP pin diodes due the femto-second optical excitation of carriers.

Original languageEnglish (US)
Pages (from-to)475-480
Number of pages6
JournalJournal of Computational Electronics
Volume1
Issue number4
DOIs
StatePublished - Dec 1 2002

Fingerprint

III-V Semiconductors
Gallium Arsenide
Diode
Diodes
diodes
Electron
Semiconductor materials
Electron devices
Charge Transport
Transport Phenomena
Transient Analysis
Femtosecond
Photoexcitation
Semiconductor Devices
Overshoot
Semiconductor devices
Simulation Tool
semiconductor devices
Transient analysis
simulators

Keywords

  • high-field transport
  • Monte Carlo simulation
  • Tera-Hertz radiation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Modeling and Simulation
  • Electrical and Electronic Engineering

Cite this

Fullband Particle-Based Simulation of High-Field Transient Transport in III–V Semiconductors. / Wigger, S.; Saraniti, Marco; Goodnick, Stephen; Leitenstorfer, A.

In: Journal of Computational Electronics, Vol. 1, No. 4, 01.12.2002, p. 475-480.

Research output: Contribution to journalArticle

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