Abstract
In this study, a full-band particle-based simulator is used to model photo-generated electron-hole pairs in Si to investigate ultra-fast charge transport. This work is motivated by previous simulations of transient transport in III-V material as well as recent experimental measurements of optically excited Si pin diodes. The simulation results show evidence of velocity overshoot at high fields (greater than 100 kV cm-1), and can be attributed to momentum relaxation.
Original language | English (US) |
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Pages (from-to) | S301-S303 |
Journal | Semiconductor Science and Technology |
Volume | 19 |
Issue number | 4 SPEC. ISS. |
DOIs | |
State | Published - Apr 1 2004 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry